Hotline : +8801325065151
Hotline : +8801325065151
| Price: | 0৳ |
| Status : | Call For Price |
| Brand: | Hitachi Japan |
Equipped with polycapillary X-ray focusing optics and
a silicon drift detector, FT160 enables high preciseness and high throughput in
nano-order level coating thickness measurement of electronic parts.
Polycapillary X-ray focusing optics
Accomplishing highly precise measurement by irradiate
high-luminance primary x-ray to the area of about 30 μmφ.
Silicon Drift Detector (SDD) as a detection system
High count rate silicon drift detector enables highly
precise measurement.
Automatic measurement assistant function
Precise multi-point automatic measurement function
helps high efficiencies of the measurement.
Easy operation enabled with simple interface and help
function of the software
Daily routine measurements can be conducted easily by
using registered application-like recipe.
Safety-conscious instrument design
Adoption of closed housing greatly minimizes the risk
of x-ray leakage.
Wide door design improves visibility of the sample and operability of the
instrument.
Specifications:
|
Model |
FT160S |
FT160Sh |
FT160 |
FT160h |
FT160L |
FT160Lh |
|
X-ray source |
Standard |
High-energy |
Standard |
High-energy |
Standard |
High-energy |
|
Mo |
W |
Mo |
W |
Mo |
W |
|
|
Elements |
Atomic No. 13(Al) to 92(U) |
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|
Sample stage (mm) |
300(W) × 245(D) |
420(W) × 320(D) |
620(W) × 620(D) |
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|
Maximum sample size (mm) |
300(X) × 245(Y) × 80(Z) |
400(X) × 300(Y) × 100(Z) |
600(X) × 600(Y) × 20(Z) |
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