Hotline : +8801325065151
Hotline : +8801325065151
| Price: | 0৳ |
| Status : | Call For Price |
| Brand: | Hitachi Japan |
The newly developed silicon drift detector (SDD)
High sensitivity and high throughput measurement
New detector with increased quantum efficiency in the
high energy region, making high-sensitivity, high-throughput measurement of the
Cd Kα, Pd Kα, Ba Kα energy bands possible.
Higher resolution and higher count rate
Compared to previous models (EA1200VX [see graph] or
EA1000VX) EA1400 excels in detecting trace elements adjacent to the main
components of the sample thanks to its high-resolution, high-count rate SDD
which allows for exceptional performance in tasks such as quality control of
metals and others.
Vacuum System and New SDD
The sensitivity of light elements is greatly improved
by using the new detector and vacuum system, which aids in process and quality
control of slag and cement.
From RoHS control to an extensive range of areas
RoHS: Screening of Cd in brass made faster
More than doubled the throughput when measuring traces
of Cd in brass and other metals compared to our previous model (EA1000VX.)
|
Lower limit of detection (mg/kg) of every element in
brass from a 300 sec. measurement |
|||
|
Element |
Cd |
Pb |
Cr |
|
Lower Limit of Detection |
4 |
13 |
11 |
*Shown data is an example, not to be considered
guaranteed performance.
Control process in smelting: fast, accurate
measurement of main elements in slag
Smelting process conditions are controlled using the
information from slag’s major components; Si, Ca, Al, Mg. The new SDD provides
considerable improvement in accuracy with light elements, like Mg, in
particular.
Quality control: detection of adhered, buried foreign
matter
With X-ray diagonal irradiation system, it has been
difficult to measure samples with uneven or irregular surface and contaminants
adhered to the base material. The EA1400, equipped with optimized X-ray
irradiation and sample observation mechanism, enables detecting and identifying
elements originating from contaminants.
Specifications:
|
Mode; |
EA1400 |
|
Measurable elements |
Na(11)～U(92) |
|
Environment |
Normal atmosphere (Al～U) |
|
X-ray direction |
X-Ray Vertical Irradiation (Coaxial Sample
Observation) |
|
X-ray source |
Small Air-cooled x-ray tube (Rh target) |
|
Detector |
Newly developed Silicon Drift Detector (SDD) |
|
Measurement Area |
1,3,5 mmφ |
|
Filter |
5 filters automatic switching |
|
Sample chamber |
304(W)×304(D)×110(H)mm |
|
Weight |
69 kg |
|
Power requirements |
AC100～240V (50/60Hz)/190VA |
|
Sample changer |
Compatible (12samples) *Optional |
Get specific details about this product from customers who own it.
