Double Beam Spectrophotometer U-2900/2910 Hitachi Japan
  • Double Beam Spectrophotometer U-2900/2910 Hitachi Japan

Double Beam Spectrophotometer U-2900/2910 Hitachi Japan

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Brand: Hitachi Japan
  • Model: U-2900/2910
  • Product Code: 1492
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Description :

Double Beam Spectrophotometer U-2900/2910 Hitachi Japan


Spectrophotometer mounting a large-size color LCD, which is simpler to use and higher in dependability.

High resolution satisfying European Pharmacopoeia (spectral bandpass: 1.5 nm).
Trace-amount measurement in biotechnological field, etc. can be carried out using optional 50, 25 and 5 micro cells.

 

Stable optics due to double beam

In double beam design, the energy of the light source is divided into two with a half mirror so that one passes through the reference side, and the other through the sample side, which is unavailable with the single beam design.
Since the reference-side energy is also incident on a detector, photometry is carried out on the basis of this signal. Therefore, an energy change in the light source can be compensated to ensure stable measurement for a long time.

 

Incorporation of stigmatic concave diffraction grating

The optics of this instrument adopts the Seya-Namioka monochromator widespread as a representative concavediffraction grating monochromator.
Because a concave diffraction grating has both beam condensing and dispersing functions, an optical system canbe configured with fewer mirrors.
In a spectrophotometer, use of fewer mirrors signifies a shorter optical path,thus giving rise to an aberration-free bright optics.
For elimination of the aberrations which were essentially unavoidable in the past, a stigmatic concave diffractiongrating has been developed by applying Hitachi’s original technology. As a result, a higher resolution has been realized.

 

A higher resolution has been achieved by eliminating coma from the Seya- Namioka monochromator which is the most popular concave diffraction grating monochromator. Its grooving is supported by the only ruling engine in Japan. The diffraction gratings of Model U-2900/2910 have also been made with this machine.

 

Spectral bandpass 1.5 nm satisfying European Pharmacopoeia

European Pharmacopoeia requires a ratio of 1.5 or larger when measuring 0.02% (V/V) solutions of toluene in hexane. In the spectrum at right, a satisfactory value of 1.6 can be confirmed.
(Sample: 0.02% solution of toluene in n-hexane)

 

Personal computer-based instrument control and data processing

U-2900 can be controlled by a PC equipped with optional UV Solutions Program. UV Solutions Program provides not only basic functions such as photometry quantitative analysis and wavelength scan but also the capability of data handling as described below.
(U-2910 is the model exclusively for operation with a PC. A PC equipped with Windows® is required for UV Solutions Program.)

Simple to use

Buttons are laid out so as to follow the operating procedure.
Hence, operations can be performed smoothly.

 

A rich variety of data processing functions

Spectrum can be expanded, contracted, smoothed, differentiated and integrated, and fundamental arithmetic calculations are applicable between spectra.

 

Powerful support for report generation

Measured data can be sent to Microsoft® Excel®. One click of the Report button suffices for data transmission.

 

Print preview

Before printing, the contents can be checked by the Print Preview command.

 

Measured data text convertible

Besides conversion into the ASCII text or JCAMP format, spectra can be saved in Metafile format.

 

Specification:

Item

Description

Optical system

Double beam

Wavelength range

190 to 1,100 nm

Spectral bandpass

1.5 nm

Display

U-2900: color LCD with backlight (26.4 cm)

Printer I/F

U-2900: Centronics interface

Serial I/F

RS-232C (exclusive for UV Solutions program)

Size (main unit)

U-2900: 500 (W) × 605 (D) × 283 (H) mm (with LCD lowered)

U-2910: 500 (W) × 605 (D) × 241 (H) mm (without PC and printer)

Weight (main unit)

U-2900: 31 kg, U-2910: 29 kg

Power supply

100, 115, 220, 230 or 240 V, 50/60 Hz

Power consumption

300 VA

 

Application Notes: UV-Visible/NIR Spectrophotometers:

NO.

Title

UV-VIS83

ANALYSIS OF CR(VI) IN TRIVALENT CHROMIUM COATING FILM BY THE DIPHENYLCARBAZIDE METHOD WITH SOLID PHASE EXTRACTION

In recent years, use of a trivalent chromium coating film,which is low in toxicity and complies with RoHS instructions, has entered mainstream use, in place of the hexavalent chromium coating film which has been widely used as a finishing agent. Measurement of the Cr(VI) contained in this corrosion protection coating film may be accomplished by extraction with boiling water, followed by application of a spectrometric method with 1,5-diphenylcarbazide. However, a high sensitivity analysis is required for the quantification of trace amounts of Cr(VI).
In this experiment, an analysis method using solid phase extraction for pretreatment was employed to analyze the trace amount of Cr(VI) contained in the boiling water extract of the trivalent chromium film. To support the quantification of trace amounts of Cr(VI),diphenylcarbazide is used to complex trace Cr(VI),which is then extracted using a NOBIAS RP-OD1E reverse solid phase extraction column (Hitachi High-Technologies). The eluate is then analyzed using a model U-1900 HITACHI Spectrophotometer. In this experiment, a water quality test kit (No.31 LR-Cr6+) using 1,5-diphenylcarbazide was used, which employs absorption spectrometry (KYORITSU CHEMICALCHECK Lab., Corp).
Model: U-1900

UV-VIS82

MEASUREMENT OF SMALL QUANTITIES OF DNA SAMPLES USING A 1µL CELL

Model: U-1900
Keywords:U-1900 Spectrophotometer, Cr(VI), chromate passivation film, water quality test kit

UV-VIS81

MEASUREMENT OF SMALL QUANTITIES OF DNA SAMPLES USING A 1µL CELL

Model: U-0080D
Keywords:Micro-sample measurement, Quantitative analysis, Purity calibration, Nucleic acid, DNA, RNA, 1µL, Small quantity cell, Diode Array

UV-VIS80

MEASUREMENT OF THE SPECTROSCOPIC PROPERTIES OF AN OPTICAL DEVICE FOR CELLULAR PHONE-BASED CAMERAS - INTRODUCTION OF A MICROSAMPLE MEASUREMENT ACCESSORY -

Model: U-4100 Keywords:Microsample measurement accessory, 60 full-sphere integrating sphere accessory, Transmittance measurement, Microlens, CCD, CMOS

UV-VIS79

VISIBLE LIGHT TRANSMITTANCE MEASUREMENT OF A PRIVACY SCREEN PROTECTOR - INTRODUCTION OF A VARIABLE ANGLE TRANSMITTANCE ACCESSORY -

Model: U-4100
Keywords:Privacy screen protector, Visible light transmittance, Transmission spectrum, Polarizer, Variable angle transmittance accessory

UV-VIS78

MEASUREMENT OF THE SPECTROSCOPIC PROPERTIES OF OPTICAL COMPONENTS FOR CD-DVD PLAYERS - INTRODUCTION OF MICROSAMPLE MEASUREMENT ACCESSORY -

Model: U-4100
Keywords:Microsample measurement accessory, Micro lens, Integrating sphere of entire sphere type of 60 mm,Transmittance measurement

UV-VIS77

MEASUREMENT OF MIRRORS ON CD PLAYER AND CD-ROM DRIVE

Model: U-4100
Keywords:CD player, CD-ROM, Mirror, 45 degree specular reflectance accessory,Absolute reflection spectrum measurement, Polarizer

UV-VIS76

VACUUM ULTRAVIOLET SPECTROSCOPY APPLIED TO A SOLUTION SAMPLE

Model: U-7000
Keywords:Vacuum ultraviolet spectrophotometer, Cell for liquid measurement, Photo resist, Excimer laser

UV-VIS75

HIGH PRECISION MEASUREMENT OF TRANSMITTANCE OF LENS 60mm FULL - SPHERE INTEGRATING SPHERE ACCESSORY -

Model: U-4100
Keywords:60mm full-sphere integrating sphere accessory, Transmittance measurement, Beam-diffusive sample, Convex lens, Concave lens

UV-VIS74

EXAMPLES OF VARIABLE ANGLE ABSOLUTE REFLECTANCE ACCESSORY - SPECULAR REFLECTANCE SPECTRA OF FILTER -

Model: U-4100
Keywords:Variable absolute reflectance accessory, Filter, Incident angle variable, Polarizer, Polarization Compotents

UV-VIS73

HIGH PRECISION TRANSMITTANCE MEASUREMENT OF QUARTZ PLATE IN UV REGION

Model: U-4100
Keywords:Transmittance baseline, Ultraviolet Region, Excimer Laser, High-sensitivity integrating sphere, Nitrogen gas purging, Optical parts for excimer laser, Transmittance characteristic

UV-VIS72

HIGH-PRECISION MEASUREMENT OF REFLECTANCE OF ALUMINUM-EVAPORATED MIRROR AND QUARTZ PLATE IN UV REGION

Keywords:5° specular reflectance baseline, Ultraviolet region, Excimer laser, High-sensitivity integrating sphere, Nitrogen gas purging, Aluminum-evaporated mirror, Reflectance characteristics, Quartz plate

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