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Brand: | Hitachi Japan |
Small
signal level differences at detector switching afford highly accurate
measurements even when the wavelength of detector is being switched.
Multiple
detectors are installed in the integrating sphere to perform measurement over a
wide range of wavelengths, from ultraviolet to visible to near infrared
regions. The changes in photometric values at detector switching (from signal
level differences) are minimized due to a design utilizing Hitachi’s expertise
in integrating sphere construction, signal processing technologies, etc
Low
stray light and low polarization characteristics are attained with Hitachi’s
high-performance prism-grating double monochromator system.
The
UH4150 adopts a prism-grating (P-G) double monochromator optical system,
continuing the established reputation of the U-4100 optical system. Large
changes in light intensity of the S and P polarization are less likely for the
prism-grating (P-G) system than for the generally used grating-grating (G-G)
system. The UH4150 offers low noise measurements, even for low transmittance
and reflectance samples.
Collimated
light beam allows accurate measurement of reflected light and scattered light.
The incident angle is important for the measurement of specular reflectance of solid samples. For focused light beam, the incident angle varies depending on the lens’s focal length, etc. Consequently, the values of simulation of design of optical thin films, such as dielectric multilayer film and prism, would differ from actual measured values. In the case of a collimated light beam, however, the incident angle is always the same with respect to the sample, leading to a highly accurate measurement of specular reflectance. Moreover, the collimated light beam isuseful for the evaluation of diffusivity (haze) and the measurement of transmittance of lenses.
A
wide variety of detectors affords the selection of detectors suitable for
measurement objectives.
Eight
types of integrating spheres of different materials, sizes, and shapes are
available.*2*3
New
ergonomic design has been adopted.
The
door of sample compartment is modified to improve the operation. An ergonomic
design is adopted by taking into account the operation of replacing samples and
accessories.
Compatible
with many of the U-4100 accessories.
Common
accessories are available for both models. Accessories used with Model U-4100
can also be used with Model UH4150*4. Since the accessories are
removable, they help to accommodate a wider range of measurement types.
Higher
throughput than Model U-4100.
While
maintaining the high-performing optical system of the model U-4100, the UH4150
provides higher throughput measurements. In the previous model, a scan speed of
600 mm/min was necessary for a measurement using a data interval of 1 nm. With
Model UH4150, you can measure at 1 nm intervals while using a scan speed of
1,200 nm/min, reducing the measurement time significantly.*5 The
UH4150 measures from 240 to 2,600 nm in approximately two minutes. It is
effective for samples requiring measurement in UV-VIS-NIR wavelength range,
such as Solar Reflective Materials.
Automatic
Measurement System
We have taken three popular peripheral systems for the UH4150 spectrophotometer—the automatic variable-angle absolute reflectance measurement system, the automatic polarization measurement systems, and 5 Degrees reflectance/transmittance measurement system with automatic X-Y stage—and converted them into standalone systems that can be purchased individually.
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